Trace element impurities in high-purity silica, 96% silica glass, borosilicate glasses and doped optical waveguide glass have been determined by spark-source mass-spectrometry, optical-emission spectrography, neutron-activation analysis, atomic-absorption and plasma emission spectrometry, spectrophotometry, voltammetry and chemical methods.
Origin
Unknown
Journal Title
Mikrochimica Acta Ii 1977 527-536
Sector
Primary Papers
Class
PP 1253