Trace Analysis Using Eds: Applications To Thin-Film And Heterogenous Samples

Critical to "trace analysis" measurement are the concepts of detection and quantification. Detection means positively identifying a chemical component. The term "Minimum Detection Limit" follows that of Currie, and is the smallest concentration that yields a net count, above system background, which will be detected with a 95% probability (with only 5% probability of false detection). This paper outlines the method and formula.

Author
B Cross & J E Augenstine
Origin
Kevex Instruments, Usa
Journal Title
Advances In X-Ray Analysis 34 1991 57-70
Sector
Primary Papers
Class
PP 112

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Trace Analysis Using Eds: Applications To Thin-Film And Heterogenous Samples
Advances In X-Ray Analysis 34 1991 57-70
PP 112
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