Thickness measurements by the method of angle-resolved, self-ratio X-ray fluorescence spectrometry (AR/SR/XFS) have been carried out on thin solid films using monochromatized synchrotron radiation at the Bonn storage ring ELSA. Synchrotron radiation was monochromatized by means of a double-crystal monochromator and fluorescence radiation was detected by a Si(Li) semiconductor detector. The results for sample systems consisting of Au on Si, Cr on Si02 and Ti02 on alkali-free glass are very satisfactory and agree well with results obtained by other methods.
Origin
Physikalisches Inst Der Universitat Bonn, Germany
Journal Title
Schott Research 1993-1995 311-315
Sector
Special Glass
Class
S 1165