This paper deals with the quantitative analysis of neodymium, erbium and ytterbium oxides in borate, silicate and tellurite glasses by means of energy dispersive x-ray analysis in a scanning electron microscope. The problem of the deconvolution of overlapping intensity peaks is discussed and calibration curves for rare earth oxides in the different base glasses are established.
Origin
Unknown
Journal Title
X-Ray Spectrometry 4 2 1975 48-51
Sector
Primary Papers
Class
PP 1264