Radiation-Induced Defects In Coo- And Ni0-Doped Fluoride, Phosphate, Silicate And Borosilicate Glasses

The influence of cobalt and nickel on the formation of irradiation-induced defects was studied in fluoride, phosphate, silicate and borosilicate glasses. Sample plates of high-purity glasses, undoped and doped with 0.3 mol% CoO and NiO, respectively, were irradiated with UV lamps and with X-rays. The subsequent defect centres, formed at ppm levels, were characterized by EPR and optical UV-VIS spectroscopy.

Author

D Moncke & D Ehrt

Origin

Otto-Schott-Inst, Jena

Journal Title

Glass Sci Technol 75 5 2002 243-253

Sector

Special Glass

Class

S 2427

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Journal Title Glass Sci Technol 75 5 2002 243-253

Class S 2427

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Radiation-Induced Defects In Coo- And Ni0-Doped Fluoride, Phosphate, Silicate And Borosilicate Glasses

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