Microstructural Studies On The Low-Temperature Crystallization Process Of Strontium Bismuth Tantalate Thin Films

The preparation of strontium bismuth tantalate (SBT) thin films at low temperatures for electronic applications is at present the subject of intense study. However, the microstructural evolution of these films has not been extensively reported, despite its importance in the determination of the final properties of the film. In this work, SBT thin films with various nominal compositions obtained by the crystallization at 650- deg C of spin-coated solutions on a silicon-based substrate are studied.