Bonding Frits For Near-Zero And Negative Expansion Substrates

Several frit systems were developed and characterized for bonding to materials with negative, or near-zero coefficient of thermal expanison (CTE). The basis of each system is a low temperature base glass (Tg=300-325 deg C), to which one or more fillers are added to lower overall CTE. The base glasses employed were selected from the Sn0-Zn0-P205 and Pb0-Zn0-B203 systems. The major filler used was a crystalline Co-Mg pyrophosphate, which is capable of undergoing a controlled phase inversion with an associated volume change. The expansion compatibility of the frits with fused silica was characterized by polarimetric measurement of expansion mismatch versus temperature using a butt seal test sample.

Author
R Morena & G L Francis
Origin
Corning Inc, Usa
Journal Title
Corning Research 1998 1-6
Sector
Special Glass
Class
S 1702

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Bonding Frits For Near-Zero And Negative Expansion Substrates
Corning Research 1998 1-6
S 1702
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