Analysis Of Metal Traces In Glasses, Ceramics And Their Raw Materials By X-Ray Fluorescence

A method was elaborated for measuring the Fe content of quartz sand used in the glass industry as well as the Fe, Ni, Cu, Zn, Y, Ce and Zr contents of fine ceramic raw materials. The sensitivity of this method is about 50 ppm in the lower atomic range and is about 20 ppm in the higher. The determination is made by specialised equipment. In the course of developing this method a multichannel analyser and Si(Li) semiconducting detector were used. The fluorescence radiation of samples was excited by 55Fe, 109Cd and 241Am.

Author
J Kiraly & T Biro
Origin
Unknown
Journal Title
12Th Conf Silicate Ind & Silicate Sci, Budapest, 6-11 2 1977 979-987
Sector
Primary Papers
Class
PP 1248

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Analysis Of Metal Traces In Glasses, Ceramics And Their Raw Materials By X-Ray Fluorescence
12Th Conf Silicate Ind & Silicate Sci, Budapest, 6-11 2 1977 979-987
PP 1248
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