Xps And Sims Characterization Of Tin-Oxide Coatings On Glass

In this paper, x-ray photoelectron spectroscopy (XPS) and secondary-ion mass spectroscopy (SIMS) have been utilized to examine both sputter-deposited tin-oxide coatings on glass subsrates and commercial hot-end coatings on glass containers.

Author
C G Pantano Et Al
Origin
Pennsylvania State University, Usa
Journal Title
Glastech Ber Glass Sci Technol 68 C1 1995 360-365
Sector
Container glass
Class
C 935

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Xps And Sims Characterization Of Tin-Oxide Coatings On Glass
Glastech Ber Glass Sci Technol 68 C1 1995 360-365
C 935
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