Both X-ray absorption near edge structures (XANES) and electron energy loss near edge structure (ELNES) are important tools in ceramic science offering information on local environment of selected elements not only in crystals but also in amorphous materials. Recent technological progress enables measurements of XANES of ppm-level dopants using modern synchrotron facilities. Combined with transmission electron microscopy, ELNES can be used to analyse the local structures with subnanometer spatial resolution. First principles methods to reproduce and interpret the spectra have been established just recently, as explained here.
Origin
Kyoto University, Japan
Journal Title
J Am Ceram Soc 88 8 2005 2013-2029
Sector
Glass Ceramics
Class
GC 638