X-ray diffraction topography, which is sensitive to local strain and/or crystallographic orientation, provides a unique view of the surface of single-crystal samples and can be used to nondestructively inspect for surface and subsurface damage. The attributes of synchrotron-based X-ray topography as applied to inspection will be described and illustrated with examples from recent experiments.
Origin
Nist, Usa
Journal Title
Int J Appl Ceram Technol 2 4 2005 336-343
Sector
Special Glass
Class
S 3002