Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSC), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. This paper reviews the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses. Finally, potential applications of the technique and possible future developments are discussed.
Origin
University Sydney, Nsw
Journal Title
Materials Sci & Eng R 110 2016 1-12
Sector
Special Glass
Class
S 4297