Transmission Electron Microscopy And Electron Energy-Loss Spectroscopy Study Of Nonstoichiometric Silicon-Carbon-Oxygen Glasses

Crystallization behaviour of Si-C-O glasses in the temperature range of 1000-4000 deg C was investigated using transmission electron microscopy (TEM) in conjunction with electron energy-loss specrsoscopy (EELS).

Author
C Turquat Et Al
Origin
University Of Bayreuth, Germany
Journal Title
J Am Ceram Soc 84 10 2001 2189-2196
Sector
Special Glass
Class
S 2269

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Transmission Electron Microscopy And Electron Energy-Loss Spectroscopy Study Of Nonstoichiometric Silicon-Carbon-Oxygen Glasses
J Am Ceram Soc 84 10 2001 2189-2196
S 2269
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