Thickness Dependence Of Fracture Stress In Glass Films Coated On Silicon

The stress required for spontaneous fracture of glass films on a silicon substrate was found to be proportional to the reciprocal square root of the film thickness.

Author
M Shimbo
Origin
Toshiba Ceramics Research And Development Centre
Journal Title
J Am Ceram Soc 1988 71 10 C-424-C-426
Sector
Special Glass
Class
S 187

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Thickness Dependence Of Fracture Stress In Glass Films Coated On Silicon
J Am Ceram Soc 1988 71 10 C-424-C-426
S 187
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