Well-crystallized Cu doped (1, 3 & 5 mol%) ZnO films were deposited on quartz substrates by sol-gel technique. The optical, microstructural and photoluminescence properties of the films were studied. It was found that the band gaps (3.38eV) of the films did not vary up to 5% Cu doping in ZnO. The preferred orientation along (002) was observed for all the films and the degree of orientation decreased with increasing the molar percentage of Cu in ZnO. Atomic force microscopy measurements were performed to study the morphology of 1, 3 & 5% Cu doped ZnO thin films; the surface roughness of 1 mol% Cu doped ZnO film was smaller (~6nm) than those of 3 and 5 mol% Cu doped ZnO films (~15-20nm).
Origin
Indian Association For Cultivation Of Science, Kolkata
Journal Title
Trans Ind Ceram Soc 64 3 2005 133-146
Sector
Special Glass
Class
S 3530