The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photo-electron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS). and sputter-induced photon spectroscopy (SIPS) - are discussed.
Origin
Unknown
Journal Title
American Ceramic Society Bulletin 60 11 1981 1154-1163
Sector
Primary Papers
Class
PP 1217