Surface And In-Depth Analysis Of Glass And Ceramics.

The most common techniques for surface analysis - Auger electron spectroscopy (AES), X-ray photo-electron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS), ion scattering spectroscopy (ISS). and sputter-induced photon spectroscopy (SIPS) - are discussed.

Author
Cc Pantano
Origin
Unknown
Journal Title
American Ceramic Society Bulletin 60 11 1981 1154-1163
Sector
Primary Papers
Class
PP 1217

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Surface And In-Depth Analysis Of Glass And Ceramics.
American Ceramic Society Bulletin 60 11 1981 1154-1163
PP 1217
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