Structure Defects In Chalcogenide Semiconductor Glasses On Data Of Positron Annihilation

In this paper some data on defects of structure in chalcogenide semiconductor glasses, investigated with positron annihilation, are generalised. These data can be used in the structure models of the undersystem of the soft chemical bonds.

Author
E P Prokop'Ev Et Al
Origin
Research Inst Of Materials, Science And Technology, Russia
Journal Title
Proc Of Xvi Icg, Beijing, China Vol7 1995 174-178
Sector
Special Glass
Class
S 1492

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Structure Defects In Chalcogenide Semiconductor Glasses On Data Of Positron Annihilation
Proc Of Xvi Icg, Beijing, China Vol7 1995 174-178
S 1492
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