Microprocessor-Controlled Flat Glass Testing With Expanded Defect Analysis And Automatic Classifying (In German)

The use of laser beam scanning with micro-processor control for inspection of flat glass is discussed briefly.

Author

H. Droscha

Origin

Unknown

Journal Title

Glastechnische Berichte 1979 52 (5) 121-122

Sector

Primary Papers

Class

PP 192b

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Your chosen publication Microprocessor-Controlled Flat Glass Testing With Expanded Defect Analysis And Automatic Classifying (In German)

Journal Title Glastechnische Berichte 1979 52 (5) 121-122

Class PP 192b

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