Melt Homogonization And Self-Organisation In Chalcogenides - Part 1

An FT-Raman profiling method is developed to monitor growth of structural homogeneity of binary GexSe100-x melts in real time (tR) non-invasively as starting materials are reacted over days. Raman spectra of quenched melts were acquired along a one inch long column of a sample in a quartz tube. In the first step of reaction, (tR)

Author

S Bhosle Et Al

Origin

University Cincinnati, Oh, Usa

Journal Title

Int J Appl Glass Sci 3 3 2012 189-204

Sector

Special Glass

Class

S 3932

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Journal Title Int J Appl Glass Sci 3 3 2012 189-204

Class S 3932

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Melt Homogonization And Self-Organisation In Chalcogenides - Part 1

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