Ion Mixing At The Interface Between Tini Films And Glass Substrates

Mixing between the films and silica and borosilicate glass was induced by argon ion bombardment and investigated by Auger electron spectroscopy.

Author

K Saito, K Nakamura, M Iwaki

Origin

Unknown

Journal Title

Thin Solid Films 1987 147 1 93-102

Sector

Special Glass

Class

S 67

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Journal Title Thin Solid Films 1987 147 1 93-102

Class S 67

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