A commercial float glass was analysed by secondary-ion mass spectrometry. The depth profiles show important variations in the 40Ca+, 24Mg+, and 28 Si+ ion intensities at the beginning of analyses, even on fresh fracture surfaces. field-induced migration of the ions or preferential sputtering cannot account for the observed variations in the secondary-ion currents.
Origin
Unknown
Journal Title
Jacs 68 5 1985 C-134
Sector
Primary Papers
Class
PP 1196