The production of thin glass imposes many challenges on glassmakers. Making glass thinner and thinner is intrinsically connected to an increasing glass ribbon speed at the cold end. Because thin glass is used to a large extent in micro-electronics, more and more stringent criteria for glass defects in terms of smaller defect sizes and defect types have to be addressed at a high detection speed. This article discusses trends in optical metrology and camera-based defect inspection.
Origin
Unknown
Journal Title
Glass Worldwide July-Aug 2014 54
Sector
Flat glass
Class
F 3588