High Performance Film Thickness Probes

German firm, Sentech Instruments, specialise in products for the characterisation of coatings on glass. This article presents the FTPadadvanced film thickness probe for the measurement of transparent and weakly-absorbing films on reflective transparent and absorbing substrates using white light reflection spectroscopy. The FTPadvanced is available as an accessory for optical microscopes, as a stand-alone unit, or can be incorporated into a combined ellipsometer/reflectometer.