The EPR spectroscopy of Mn2+ spin label was used to investigate the structural evolution of SiO2 xerogel. Analysis of the EPR spectra shows a decrease of the half width of spectral lines of the Mn2+ hyperfine structure. This is caused by retardation of the spin label mobility as a consequence of densification and strengthening of the xerogel structure with the treatment temperature. The same features were observed in the measured spectra of the heat treated xerogel during its ageing. A model was proposed and statistical analysis was used to verify its reliablity.
Origin
Slovak Academy Of Sciences, Czech
Journal Title
Physics And Chemistry Of Glasses 34 4 1993 164-167
Sector
Special Glass
Class
S 738