Precise measurements of the thin films used in the glass industry are important for quality glass coating requirements. Both film thickness and optical properties are critical to the heat protection or anti-reflection coating behaviour. Spectroscopic ellipsometry is becoming used extensively to characterise dielectrics, organics, metals and semiconductors. This article describes why spectroscopic ellipsometry is important for glass coatings and discusses a few applications, including multilayer anti-reflection coatings.
Origin
Lot Oriel Gmbh, Germany & Saint-Gobain Recherche, France
Journal Title
Glastech Ber Glass Sci Technol 74 5 2001 152-155
Sector
Special Glass
Class
S 2255