Electron Probe Micro-Analysis Of Glass Cords And Knots

Glass defects can originate for a variety of reasons, for example: Insufficient batch mixing or melt homogenization; surface volatilization; inadequate thermal mixing; inadequate melt bubbling; improper selection of glass making raw materials. The list is long. Solution to glass quality problems can be realized through accurate knowledge of defect chemistry. Although the conventional SEM has good microanalysis capabilities, EPMA (Electron Probe Micro Analyzer) has been found to be superior for very accurate chemical analysis of small glass defects.

Author
R C Marlor
Origin
Osram Sylvania Inc, Usa
Journal Title
The Glass Researcher 9 2 Spring 2000 9-10
Sector
Special Glass
Class
S 1961

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Electron Probe Micro-Analysis Of Glass Cords And Knots
The Glass Researcher 9 2 Spring 2000 9-10
S 1961
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