Correlation Of The Results Of Sims And Ellipsometric Investigations Of Polished Optical Glasses

Experimental values of ellipsometric parameters were used to evaluate the refractive index and thickness of thin films produced by polishing optical surfaces. SIMS was used for chamical analysis of the glass surface.

Author
H Mrozinski
Origin
Unknown
Journal Title
Optik, Stuttg 1987 75 2 82-4
Sector
Special Glass
Class
S 44

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Correlation Of The Results Of Sims And Ellipsometric Investigations Of Polished Optical Glasses
Optik, Stuttg 1987 75 2 82-4
S 44
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