Correlation Between Microstructure And Electrical Properties Of A-Site Substituted Ya103 Ceramics

The effect of microstructural parameters on the electrical properties of Y1-xCaxAlO3-8 (x=0.10, 0.20) synthesized by Pechini and solid state routes was studied. A study on the phases formed was conducted using X-ray diffraction. Microstructural analyses were performed by SEM coupled energy dispersive X-ray spectroscopy and electron backscatter diffraction techniques. A correlation between the microstructural features and the impedance measurements was attempted to understand the effect of preparation route on the electrical conductivity. The role played by microstructural elements such as grain size, grain boundary area, grain orientation and grain boundary thickness on the electrical behaviour of doped YA103 ceramics was investigated.