The way in which the intensity of the characteristic x-rays decreases with time has been investigated to find the effects of thickness of the evaporated conductive film, electron beam diameter, beam intensity and type of evaporated material. The best working conditions for quantitative microanalysis of silicate glasses can be determined.
Origin
Unknown
Journal Title
Glastechnische Berichte 46 10 1973 196-200
Sector
Primary Papers
Class
PP 1291