Fragments (in the ml size range) from 81 tempered sheet glasses were used in order to evaluate the source discrimination capabilities of refractive indices and elemental composition, by using energy dispersive X-ray fluorescence (EDXRF) and inductively coupled plasma atomic emission spectrometry (ICP-AES). The X-ray intensities of five elements were determined by EDXRF with precisions of between 1 and 25%. The concentrations of nine elements were determined using ICP-AES and precisions of from less than 1 to about 10% were obtained. Both methods offer improved discrimination capability over RI measurements alone. The technique of EDXRF provides rapid, non-destructive testing and is widely available in forensic laboratories.
Comparison Of Refractive Index, Energy Dispersive X-Ray Fluorescence & Inductively Coupled Plasma Atomic Emission Spectrometry For Forensic Characterization Of Sheet Glass Fragments
Origin
Forensic Science Research Unit, Fbi Academy, Quantico, Va, Usa
Journal Title
J Analytical Atomic Spectrometry, 6 (Sept) 1991 451-456
Sector
Special Glass
Class
S 1271