Atomic Force Microscopy For The Determination Of Refractive Index Profiles Of Optical Fibres And Waveguides: A Quantitative Study

The use of preferential etching and atomic force microscopy to measure refractive index profiles of optical fibres is investigated.

Author
S T Huntington Et Al
Origin
Unknown
Journal Title
J Apply Phys (Usa) 82 6 1997 2730-2734
Sector
Special Glass
Class
S 1600b

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Atomic Force Microscopy For The Determination Of Refractive Index Profiles Of Optical Fibres And Waveguides: A Quantitative Study
J Apply Phys (Usa) 82 6 1997 2730-2734
S 1600b
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