Analysis Of Sodium Depth Profiles In Glasses Using Secondary Ion Mass Spectrometry (Sims)

Several aspects of the SIMS analysis of glass samples are discussed with emphasis on the measurement of sodium depth profiles. A method developed for semiquantitative SIMS analysis was used to calculate the element concentrations in a commercial soda-lime-silica glass. The method gave better than semi-quantitative results for all constituents, including Na and O.

Author
Rg Gossink And Others
Origin
Unknown
Journal Title
Silicates Industriels Xliv 2 1979 35-41
Sector
Primary Papers
Class
PP 1232

Request article (free for British Glass members)

Analysis Of Sodium Depth Profiles In Glasses Using Secondary Ion Mass Spectrometry (Sims)
Silicates Industriels Xliv 2 1979 35-41
PP 1232
Are you a member?
This question is for testing whether or not you are a human visitor and to prevent automated spam submissions.
2 + 11 =
Solve this simple math problem and enter the result. E.g. for 1+3, enter 4.