Analysis Of Glasses, Oxides And Concentration Profiles In Surfaces Or Suraface Films Using High Energy Ions By Secondary Ion Emission (Sims), Photons (Ibsca, Scaniir) And Reflected Ions (Leiss, Heiss). (In German)

Various surface analysis techniques are described and results obtained on glasses and oxides are reviewed briefly.

Author
H Bach
Origin
Unknown
Journal Title
Glastechnische Berichte 53 3 1980 58-62
Sector
Primary Papers
Class
PP 1229

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Analysis Of Glasses, Oxides And Concentration Profiles In Surfaces Or Suraface Films Using High Energy Ions By Secondary Ion Emission (Sims), Photons (Ibsca, Scaniir) And Reflected Ions (Leiss, Heiss). (In German)
Glastechnische Berichte 53 3 1980 58-62
PP 1229
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